Biasing potentials monitoring circuit for multichannel radiation imaging ASIC in-system diagnostics

Weronika Zubrzycka, Krzysztof Kasinski. Biasing potentials monitoring circuit for multichannel radiation imaging ASIC in-system diagnostics. In 24th International Conference Mixed Design of Integrated Circuits and Systems, MIXDES 2017, Bydgoszcz, Poland, June 22-24, 2017. pages 234-239, IEEE, 2017. [doi]

@inproceedings{ZubrzyckaK17,
  title = {Biasing potentials monitoring circuit for multichannel radiation imaging ASIC in-system diagnostics},
  author = {Weronika Zubrzycka and Krzysztof Kasinski},
  year = {2017},
  doi = {10.23919/MIXDES.2017.8005190},
  url = {https://doi.org/10.23919/MIXDES.2017.8005190},
  researchr = {https://researchr.org/publication/ZubrzyckaK17},
  cites = {0},
  citedby = {0},
  pages = {234-239},
  booktitle = {24th International Conference Mixed Design of Integrated Circuits and Systems, MIXDES 2017, Bydgoszcz, Poland, June 22-24, 2017},
  publisher = {IEEE},
  isbn = {978-83-63578-12-1},
}