Finite Element Analysis for Yeast Cells using Electrical Capacitance Tomography

N. A. Zulkiflli, Jaysuman Pusppanathan, Pei Ling Leow, S. M. Din, M. F. Rahmat, Y. K. Wong, F. A. Phang, N. F. A. B. Rahman. Finite Element Analysis for Yeast Cells using Electrical Capacitance Tomography. In 2019 IEEE International Conference on Signal and Image Processing Applications, ICSIPA 2019, Kuala Lumpur, Malaysia, September 17-19, 2019. pages 346-350, IEEE, 2019. [doi]

@inproceedings{ZulkiflliPLDRWP19,
  title = {Finite Element Analysis for Yeast Cells using Electrical Capacitance Tomography},
  author = {N. A. Zulkiflli and Jaysuman Pusppanathan and Pei Ling Leow and S. M. Din and M. F. Rahmat and Y. K. Wong and F. A. Phang and N. F. A. B. Rahman},
  year = {2019},
  doi = {10.1109/ICSIPA45851.2019.8977735},
  url = {https://doi.org/10.1109/ICSIPA45851.2019.8977735},
  researchr = {https://researchr.org/publication/ZulkiflliPLDRWP19},
  cites = {0},
  citedby = {0},
  pages = {346-350},
  booktitle = {2019 IEEE International Conference on Signal and Image Processing Applications, ICSIPA 2019, Kuala Lumpur, Malaysia, September 17-19, 2019},
  publisher = {IEEE},
  isbn = {978-1-7281-3377-5},
}