Saif alZahir, Radwa Hamma. New gage for measuring image quality. In IEEE 28th Canadian Conference on Electrical and Computer Engineering, CCECE 2015, Halifax, NS, Canada, May 3-6, 2015. pages 1223-1227, IEEE, 2015. [doi]
@inproceedings{alZahirH15,
title = {New gage for measuring image quality},
author = {Saif alZahir and Radwa Hamma},
year = {2015},
doi = {10.1109/CCECE.2015.7129452},
url = {http://dx.doi.org/10.1109/CCECE.2015.7129452},
researchr = {https://researchr.org/publication/alZahirH15},
cites = {0},
citedby = {0},
pages = {1223-1227},
booktitle = {IEEE 28th Canadian Conference on Electrical and Computer Engineering, CCECE 2015, Halifax, NS, Canada, May 3-6, 2015},
publisher = {IEEE},
isbn = {978-1-4799-5829-0},
}