Applying Extended Resolution and Forced Patterns on Random 3-SAT instances

Nathan Bruning, Tim Koopman, Siem Kok, Joris Scharpff, Jip-Man Vuong. Applying Extended Resolution and Forced Patterns on Random 3-SAT instances. Technical Report Delft University of Technology, 02 2009.

Authors

Nathan Bruning

Identified as Nathan Bruning
(Delft University of Technology, The Netherlands
)

Tim Koopman

Identified as Tim Koopman
(TU Delft
)

Siem Kok

This author has not been identified. Look up ' Siem Kok' in Google

Joris Scharpff

This author has not been identified. Look up ' Joris Scharpff' in Google

Jip-Man Vuong

This author has not been identified. Look up ' Jip-Man Vuong' in Google