Reliability in the face of variability in nanometer embedded memories

Shrikanth Ganapathy. Reliability in the face of variability in nanometer embedded memories. PhD thesis, Polytechnic University of Catalonia, Spain, 2014. [doi]

@phdthesis{es-1121,
  title = {Reliability in the face of variability in nanometer embedded memories},
  author = {Shrikanth Ganapathy},
  year = {2014},
  url = {http://hdl.handle.net/10803/144560},
  researchr = {https://researchr.org/publication/es-1121},
  cites = {0},
  citedby = {0},
  school = {Polytechnic University of Catalonia, Spain},
}