Evolutionary modular neural networks for run-time data analysis across semiconductor test area processes and equipment

Emilio Miguelañez Martín. Evolutionary modular neural networks for run-time data analysis across semiconductor test area processes and equipment. PhD thesis, Heriot-Watt University, Edinburgh, UK, 2006. [doi]

@phdthesis{ethos-13477,
  title = {Evolutionary modular neural networks for run-time data analysis across semiconductor test area processes and equipment},
  author = {Emilio Miguelañez Martín},
  year = {2006},
  url = {http://hdl.handle.net/10399/2015},
  note = {British Library, EThOS},
  researchr = {https://researchr.org/publication/ethos-13477},
  cites = {0},
  citedby = {0},
  school = {Heriot-Watt University, Edinburgh, UK},
}