A SAT based test generation method for delay fault testing of macro based circuits - researchr publication bibtex

researchr

You are not signed in
Sign in
Sign up

Santino Mele. A SAT based test generation method for delay fault testing of macro based circuits. PhD thesis, University of Ferrara, Italy, 2010. [doi]

@phdthesis{it-2024,
  title = {A SAT based test generation method for delay fault testing of macro based circuits},
  author = {Santino Mele},
  year = {2010},
  url = {https://hdl.handle.net/11392/2388685},
  researchr = {https://researchr.org/publication/it-2024},
  cites = {0},
  citedby = {0},
  school = {University of Ferrara, Italy},
}

runs on WebDSL