Modeling of conduction and reliability characteristics for phase change non volatile memories

Davide Fugazza. Modeling of conduction and reliability characteristics for phase change non volatile memories. PhD thesis, Polytechnic University of Milan, Italy, 2010. [doi]

@phdthesis{it-2555,
  title = {Modeling of conduction and reliability characteristics for phase change non volatile memories},
  author = {Davide Fugazza},
  year = {2010},
  url = {https://opac.bncf.firenze.sbn.it/bncf-prod/resource?uri=CFI0775111},
  researchr = {https://researchr.org/publication/it-2555},
  cites = {0},
  citedby = {0},
  school = {Polytechnic University of Milan, Italy},
}