Davide Fugazza. Modeling of conduction and reliability characteristics for phase change non volatile memories. PhD thesis, Polytechnic University of Milan, Italy, 2010. [doi]
@phdthesis{it-2555, title = {Modeling of conduction and reliability characteristics for phase change non volatile memories}, author = {Davide Fugazza}, year = {2010}, url = {https://opac.bncf.firenze.sbn.it/bncf-prod/resource?uri=CFI0775111}, researchr = {https://researchr.org/publication/it-2555}, cites = {0}, citedby = {0}, school = {Polytechnic University of Milan, Italy}, }