Jill Sibert, Janusz Rajski, editors, 2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007. IEEE, 2007. [doi]
Conference: itc2007
@proceedings{itc-2007,
title = {2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007},
year = {2007},
url = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=4437545},
researchr = {https://researchr.org/publication/itc-2007},
cites = {0},
citedby = {0},
booktitle = {2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007},
conference = {itc},
editor = {Jill Sibert and Janusz Rajski},
publisher = {IEEE},
isbn = {1-4244-1128-9},
}