Vei-Han Chan. Hot-carrier reliability evaluation for CMOS devices and circuits. PhD thesis, Massachusetts Institute of Technology, Cambridge, MA, USA, 1995. [doi]
@phdthesis{ndltd-553,
title = {Hot-carrier reliability evaluation for CMOS devices and circuits},
author = {Vei-Han Chan},
year = {1995},
url = {http://hdl.handle.net/1721.1/36532},
note = {ndltd.org (oai:dspace.mit.edu:1721.1/36532)},
researchr = {https://researchr.org/publication/ndltd-553},
cites = {0},
citedby = {0},
school = {Massachusetts Institute of Technology, Cambridge, MA, USA},
}