Mohamed Amroune, Makhlouf Derdour, Ahmed Ahmim, editors, 2018 3rd International Conference on Pattern Analysis and Intelligent Systems (PAIS), Tebessa, Algeria, October 24-25, 2018. IEEE, 2018. [doi]
Conference: pais2018
@proceedings{pais-2018,
title = {2018 3rd International Conference on Pattern Analysis and Intelligent Systems (PAIS), Tebessa, Algeria, October 24-25, 2018},
year = {2018},
url = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=8579098},
researchr = {https://researchr.org/publication/pais-2018},
cites = {0},
citedby = {0},
booktitle = {2018 3rd International Conference on Pattern Analysis and Intelligent Systems (PAIS), Tebessa, Algeria, October 24-25, 2018},
conference = {pais},
editor = {Mohamed Amroune and Makhlouf Derdour and Ahmed Ahmim},
publisher = {IEEE},
isbn = {978-1-5386-4238-2},
}