Built-in-Self-Test and Digital Self-Calibration for RF SoCs

Sleiman Bou Sleiman, Mohammed Ismail. Built-in-Self-Test and Digital Self-Calibration for RF SoCs. Springer Briefs in Electrical and Computer Engineering, Springer, 2012. [doi]

@book{sbece-Bou-SleimanI12,
  title = {Built-in-Self-Test and Digital Self-Calibration for RF SoCs},
  author = {Sleiman Bou Sleiman and Mohammed Ismail},
  year = {2012},
  doi = {10.1007/978-1-4419-9548-3},
  url = {http://dx.doi.org/10.1007/978-1-4419-9548-3},
  researchr = {https://researchr.org/publication/sbece-Bou-SleimanI12},
  cites = {0},
  citedby = {0},
  series = {Springer Briefs in Electrical and Computer Engineering},
  publisher = {Springer},
  isbn = {978-1-4419-9548-3},
}