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SIGMETRICS 2010, Proceedings of the 2010 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems, New York, New York, USA, 14-18 June 2010

Vishal Misra, Paul Barford, Mark S. Squillante, editors, SIGMETRICS 2010, Proceedings of the 2010 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems, New York, New York, USA, 14-18 June 2010. ACM, 2010.

Conference: sigmetrics2010

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