Proceedings of the 2017 ACM SIGMETRICS / International Conference on Measurement and Modeling of Computer Systems, Urbana-Champaign, IL, USA, June 05 - 09, 2017 - researchr publication authors

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Bruce E. Hajek, Sewoong Oh, Augustin Chaintreau, Leana Golubchik, Zhi-Li Zhang, editors, Proceedings of the 2017 ACM SIGMETRICS / International Conference on Measurement and Modeling of Computer Systems, Urbana-Champaign, IL, USA, June 05 - 09, 2017. ACM, 2017. [doi]

Conference: sigmetrics2017

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