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Structural, Syntactic, and Statistical Pattern Recognition, Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, Proceedings

Dit-Yan Yeung, James T. Kwok, Ana L. N. Fred, Fabio Roli, Dick de Ridder, editors, Structural, Syntactic, and Statistical Pattern Recognition, Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, Proceedings. Volume 4109 of Lecture Notes in Computer Science, Springer, 2006.

Conference: gacm2006

Editors

Dit-Yan Yeung

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James T. Kwok

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Ana L. N. Fred

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Fabio Roli

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Dick de Ridder

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