2017 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2017, Hsinchu, Taiwan, April 24-27, 2017. IEEE, 2017. [doi]
Conference: vlsi-dat2017
@proceedings{vlsi-dat-2017, title = {2017 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2017, Hsinchu, Taiwan, April 24-27, 2017}, year = {2017}, url = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=7936426}, researchr = {https://researchr.org/publication/vlsi-dat-2017}, cites = {0}, citedby = {0}, booktitle = {2017 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2017, Hsinchu, Taiwan, April 24-27, 2017}, conference = {vlsi-dat}, publisher = {IEEE}, isbn = {978-1-5090-3969-2}, }