- Carl Edward Gray, David C. Keezer. Extending a DWDM Optical Network Test System to 12 Gbps x4 Channels. J. Electronic Testing, 27(3):351-361, 2011.
- Vincent Kerzerho, Mariane Comte, Florence Azaïs, Philippe Cauvet, Serge Bernard, Michel Renovell. Digital Test Method for Embedded Converters with Unknown-Phase Harmonics. J. Electronic Testing, 27(3):335-350, 2011.
- Qais Al-Gayem, Hongyuan Liu, Andrew Richardson, Nick Burd. Test Strategies for Electrode Degradation in Bio-Fluidic Microsystems. J. Electronic Testing, 27(1):57-68, 2011.
- Haralampos-G. D. Stratigopoulos, K. Chakrabarty. Guest Editorial. J. Electronic Testing, 27(3):223, 2011.
- Nicolas Pous, Florence Azaïs, Laurent Latorre, Jochen Rivoir. A Level-Crossing Approach for the Analysis of RF Modulated Signals Using Only Digital Test Resources. J. Electronic Testing, 27(3):289-303, 2011.
- Deepa Mannath, David Cohen, Victor Montaño-Martinez, Rick Hudgens, Elida de-Obaldia, Shai Kush, Simon S. Ang. Methodology to Replace Sensitivity BER and Transmit Power Production Tests in Bluetooth Devices with BiSTs. J. Electronic Testing, 27(3):253-266, 2011.
- Bin Zhou, Liyi Xiao, Yizheng Ye, Xin-chun Wu. Optimization of Test Power and Data Volume in BIST Scheme Based on Scan Slice Overlapping. J. Electronic Testing, 27(1):43-56, 2011.
- Sukeshwar Kannan, Bruce C. Kim, Ganesh Srinivasan, Friedrich Taenzler, Richard Antley, Craig Force. Embedded RF Circuit Diagnostic Technique with Multi-Tone Dither Scheme. J. Electronic Testing, 27(3):241-252, 2011.
- Le Jin. Application of the Kalman Filter in Linearity Testing of Analog-to-Digital Converters. J. Electronic Testing, 27(2):163-175, 2011.
- Jeydmer Aristizabal, Badr Omrane, Clinton K. Landrock, Sasan Vosoogh-Grayli, Yindar Chuo, Jasbir N. Patel, Bozena Kaminska, Carlo Menon. Tungsten Lamps as an Affordable Light Source for Testing of Photovoltaic Cells. J. Electronic Testing, 27(3):403-410, 2011.