- Tapobrata Dhar, Ranit Das, Chandan Giri, Surajit Kumar Roy. Threshold Analysis Using Probabilistic Xgboost Classifier for Hardware Trojan Detection. J. Electronic Testing, 39(4):447-463, August 2023.
- 2022 Reviewers. J. Electronic Testing, 39(1):5-6, February 2023.
- Vinod S. Chippalkatti, Rajashekhar C. Biradar, Venkatesh Shenoy, P. Udayakumar. Efficient Test and Characterization of Space Transmit-Receive Modules Using Scalable and Multipurpose Automated Test System. J. Electronic Testing, 39(4):501-519, August 2023.
- 2022 JETTA-TTTC Best Paper Award. J. Electronic Testing, 39(5):537-538, December 2023.
- Vishwani D. Agrawal. Editorial. J. Electronic Testing, 39(1):1-2, February 2023.
- Tiago R. Balen, Carlos J. González, Ingrid F. V. Oliveira, Leomar S. da Rosa Jr., Rafael Iankowski Soares, Rafael B. Schvittz, Nemitala Added, Eduardo L. A. Macchione, Vitor A. P. Aguiar, Marcilei Aparecida Guazzelli, Nilberto H. Medina, Paulo F. Butzen. Evaluating the Reliability of Different Voting Schemes for Fault Tolerant Approximate Systems. J. Electronic Testing, 39(4):409-420, August 2023.
- Gayathri Lakshmi, V. Udaya Sankar, Y. Siva Sankar. A Survey of PCB Defect Detection Algorithms. J. Electronic Testing, 39(5):541-554, December 2023.
- R. Saravana Ram, M. Lordwin Cecil Prabhaker. Diagnosis of Analog and Digital Circuit Faults Using Exponential Deep Learning Neural Network. J. Electronic Testing, 39(4):421-433, August 2023.
- Richa Sharma, G. K. Sharma 0001, Manisha Pattanaik, V. S. S. Prashant. Structural and SCOAP Features Based Approach for Hardware Trojan Detection Using SHAP and Light Gradient Boosting Model. J. Electronic Testing, 39(4):465-485, August 2023.
- Chung-Huang Yeh, Jwu E. Chen. Multiple Retest Systems for Screening High-Quality Chips. J. Electronic Testing, 39(2):207-225, April 2023.