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- Vijaypal Singh Rathor, Akshat Rastogi. HT-Pred: An Extensive Methodology for Dataset Preparation and Hardware Trojan Prediction using Gate-Level Netlist. J. Electronic Testing, 41(4):467-482, August 2025.
- Munish Malik, Neelam Rup Prakash, Ajay Kumar, Jasbir Kaur, Amit Singh, Kavita Monga. Analyzing the Effectiveness of Various NMOS Layouts for Total Ionizing Dose Hardening in 180nm CMOS. J. Electronic Testing, 41(3):303-312, June 2025.
- Sami El Amraoui, Aghiles Douadi, Régis Leveugle, Paolo Maistri. On the Harmonic Locking of Ring Oscillators under Single ElectroMagnetic Pulsed Fault Injection in FPGAs. J. Electronic Testing, 41(3):257-272, June 2025.
- Chloe Tain, Savita Patil, Hussain Al-Asaad. Survey of Verification of RISC-V Processors. J. Electronic Testing, 41(2):111-138, April 2025.
- Enrico Magliano, Alessandro Savino, Stefano Di Carlo. Real-time Embedded System Fault Injector Framework for Micro-architectural State Based Reliability Assessment. J. Electronic Testing, 41(2):193-208, April 2025.
- Shounak Rushikesh Sugave, Yogesh R. Kulkarni, Balaso Jagdale 0001, Vitthal Gutte. Fault-Aware Test Case Prioritization in Software Testing Using Jaya Archimedes Optimization Algorithm. J. Electronic Testing, 41(1):41-61, February 2025.
- Marko S. Andjelkovic, Milos Krstic. Analysis and Modeling of Single Event Transient Generation in Standard Combinational Cells. J. Electronic Testing, 41(3):287-302, June 2025.
- Wenbing Xie, Ruixue Guan, Fanyue Yu, Yiming Zhang. PrecIRisc: A High-Precision and Low-Bloat Dynamic Binary Instrumentation Tailored for RISC Architectures. J. Electronic Testing, 41(4):483-502, August 2025.
- M. Shafkat M. Khan, Chengjie Xi, Nitin Varshney, Je-Hyeong Bahk, Navid Asadizanjani. Inherent Hardware Identifiers: Advancing IC Traceability and Provenance in the Multi-Die Era. J. Electronic Testing, 41(1):85-107, February 2025.