- 2022 Reviewers. J. Electronic Testing, 39(1):5-6, February 2023.
- Vishwani D. Agrawal. Editorial. J. Electronic Testing, 39(1):1-2, February 2023.
- Chung-Huang Yeh, Jwu E. Chen. Multiple Retest Systems for Screening High-Quality Chips. J. Electronic Testing, 39(2):207-225, April 2023.
- Vishwani D. Agrawal. Editorial. J. Electronic Testing, 39(3):263-264, June 2023.
- Kunwer Mrityunjay Singh, Jatindra Kumar Deka, Santosh Biswas. Incomplete Testing of SOC. J. Electronic Testing, 39(3):387-402, June 2023.
- Isaac Bruce, Praise O. Farayola, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi 0001, Degang Chen 0001. A Weighted-Bin Difference Method for Issue Site Identification in Analog and Mixed-Signal Multi-Site Testing. J. Electronic Testing, 39(1):57-69, February 2023.
- Wenjing Tang, Jing Su, Yuchan Gao. Hardware Trojan Detection Method Based on Dual Discriminator Assisted Conditional Generation Adversarial Network. J. Electronic Testing, 39(2):129-140, April 2023.
- Test Technology Newsletter. J. Electronic Testing, 39(1):7-9, February 2023.
- Bahareh Asadi, Syed Maqsood Zia, Hamza Mohammed Ridha Al-Khafaji, Asghar Mohamadian. Network-on-Chip and Photonic Network-on-Chip Basic Concepts: A Survey. J. Electronic Testing, 39(1):11-25, February 2023.
- Ahmad Menbari, Hadi Jahanirad. A Tunable Concurrent BIST Design Based on Reconfigurable LFSR. J. Electronic Testing, 39(2):245-262, April 2023.