Jacques L. Athow, Come Rozon, Dhamin Al-Khalili, J. M. Pierre Langlois. A CNFET-based characterization framework for digital circuits. In 18th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2011, Beirut, Lebanon, December 11-14, 2011. pages 681-684, IEEE, 2011. [doi]
Abstract is missing.