Wei Bian, Jin He, Lining Zhang, Jian Zhang 0002, Mansun Chan. Sub-threshold behavior of long channel undoped cylindrical surrounding-gate MOSFETs. Microelectronics Reliability, 49(8):897-903, 2009. [doi]
@article{BianHZZC09,
title = {Sub-threshold behavior of long channel undoped cylindrical surrounding-gate MOSFETs},
author = {Wei Bian and Jin He and Lining Zhang and Jian Zhang 0002 and Mansun Chan},
year = {2009},
doi = {10.1016/j.microrel.2009.05.008},
url = {http://dx.doi.org/10.1016/j.microrel.2009.05.008},
researchr = {https://researchr.org/publication/BianHZZC09},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {49},
number = {8},
pages = {897-903},
}