Brandon L. Dell, Jonathan F. Bolus, Travis N. Blalock. An automated unique tagging system using CMOS process variation. In Hai Zhou, Enrico Macii, Zhiyuan Yan, Yehia Massoud, editors, Proceedings of the 17th ACM Great Lakes Symposium on VLSI 2007, Stresa, Lago Maggiore, Italy, March 11-13, 2007. pages 216-218, ACM, 2007. [doi]
Abstract is missing.