Tolerating multiple faults with proximate manifestations in FPGA-based critical designs for harsh environments

Jaime Espinosa, David de Andrés, Juan Carlos Ruiz, Pedro J. Gil. Tolerating multiple faults with proximate manifestations in FPGA-based critical designs for harsh environments. In Dirk Koch, Satnam Singh, Jim Tørresen, editors, 22nd International Conference on Field Programmable Logic and Applications (FPL), Oslo, Norway, August 29-31, 2012. pages 292-299, IEEE, 2012. [doi]

Abstract

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