Using Similarity to the Previous Problem to Improve Bayesian Knowledge Tracing

William J. Hawkins, Neil T. Heffernan. Using Similarity to the Previous Problem to Improve Bayesian Knowledge Tracing. In Sergio GutiƩrrez Santos, Olga C. Santos, editors, Proceedings of the Workshops held at Educational Data Mining 2014, co-located with 7th International Conference on Educational Data Mining (EDM 2014), London, United Kingdom, July 4-7, 2014. Volume 1183 of CEUR Workshop Proceedings, CEUR-WS.org, 2014. [doi]

Abstract

Abstract is missing.