3D IC test scheduling using simulated annealing

Chih-Yao Hsu, Chun-Yi Kuo, James Chien-Mo Li, Krishnendu Chakrabarty. 3D IC test scheduling using simulated annealing. In Proceedings of Technical Program of 2012 VLSI Design, Automation and Test, VLSI-DAT 2012, Hsinchu, Taiwan, April 23-25, 2012. pages 1-4, IEEE, 2012. [doi]

Abstract

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