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Statistical thermal evaluation and mitigation techniques for 3D Chip-Multiprocessors in the presence of process variations

Da-Cheng Juan, Siddharth Garg, Diana Marculescu. Statistical thermal evaluation and mitigation techniques for 3D Chip-Multiprocessors in the presence of process variations. In Design, Automation and Test in Europe, DATE 2011, Grenoble, France, March 14-18, 2011. pages 383-388, IEEE, 2011. [doi]

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