Salin Junsangsri, Fabrizio Lombardi, Jie Han. Evaluating the impact of spike and flicker noise in phase change memories. In 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFTS 2015, Amherst, MA, USA, October 12-14, 2015. pages 1-6, IEEE, 2015. [doi]
Abstract is missing.