Automated Scan Chain Division for Reducing Shift and Capture Power During Broadside At-Speed Test

Ho Fai Ko, Nicola Nicolici. Automated Scan Chain Division for Reducing Shift and Capture Power During Broadside At-Speed Test. IEEE Trans. on CAD of Integrated Circuits and Systems, 27(11):2092-2097, 2008. [doi]

Abstract

Abstract is missing.