IEEE Trans. on CAD of Integrated Circuits and Systems - researchr journal

researchr

You are not signed in
Sign in
Sign up

Junwei Sun, Jianling Yang, Peng Liu 0038, Yanfeng Wang. Design of General Flux-Controlled and Charge-Controlled Memristor Emulators Based on Hyperbolic Functions. IEEE Trans. on CAD of Integrated Circuits and Systems, 42(3):956-967, March 2023.
Lanfei Wang, Lingxi Xie, Kaifeng Bi, Kaili Zhao, Jun Guo 0002, Qi Tian 0001. M²NAS: Joint Neural Architecture Optimization System With Network Transmission. IEEE Trans. on CAD of Integrated Circuits and Systems, 42(8):2631-2642, 2023.
Yung-Chuan Su, Shi-Yu Huang. Clock-Latency-Aware Fault-Tolerant DLL for Multi-Die Clock Synchronization. IEEE Trans. on CAD of Integrated Circuits and Systems, 42(8):2761-2765, 2023.
Kejun Chen, Orlando Arias, Xiaolong Guo, Qingxu Deng, Yier Jin. IP-Tag: Tag-Based Runtime 3PIP Hardware Trojan Detection in SoC Platforms. IEEE Trans. on CAD of Integrated Circuits and Systems, 42(1):68-81, 2023.
Songyun Qu, Bing Li 0017, Shixin Zhao, Lei Zhang, Ying Wang 0001. A Coordinated Model Pruning and Mapping Framework for RRAM-Based DNN Accelerators. IEEE Trans. on CAD of Integrated Circuits and Systems, 42(7):2364-2376, July 2023.
Nils Hölscher, Christian Hakert, Hassan Nassar, Kuan-Hsun Chen, Lars Bauer, Jian-Jia Chen, Jörg Henkel. Memory Carousel: LLVM-Based Bitwise Wear Leveling for Nonvolatile Main Memory. IEEE Trans. on CAD of Integrated Circuits and Systems, 42(8):2527-2539, 2023.
Dimitrios Danopoulos, Georgios Zervakis 0001, Kostas Siozios, Dimitrios Soudris, Jörg Henkel. AdaPT: Fast Emulation of Approximate DNN Accelerators in PyTorch. IEEE Trans. on CAD of Integrated Circuits and Systems, 42(6):2074-2078, June 2023.
Jianwang Zhai, Chen Bai, Binwu Zhu, Yici Cai, Qiang Zhou 0001, Bei Yu 0001. McPAT-Calib: A RISC-V BOOM Microarchitecture Power Modeling Framework. IEEE Trans. on CAD of Integrated Circuits and Systems, 42(1):243-256, 2023.
Chenlin Ma, Hao Yang, Shangyu Wu, Yi Wang 0003, Rui Mao 0001. Tidal-Tree-Mem: Toward Read-Intensive Key-Value Stores With Tidal Structure Based on LSM-Tree. IEEE Trans. on CAD of Integrated Circuits and Systems, 42(2):423-436, February 2023.
Xiaolei Yu, Jing He, Qianhui Li, Bo Zhang, Xianliang Wang, Liu Yang, Tian-Chun Ye 0001, Qi Wang, Zongliang Huo. LIAD: A Method for Extending the Effective Time of 3-D TLC NAND Flash Hard Decision. IEEE Trans. on CAD of Integrated Circuits and Systems, 42(5):1705-1717, May 2023.

runs on WebDSL