John Kriz, Tom Joyner, Ted Wilson, Greg McGraner. Correlated, Real Time Multi-spectral Sensor Test and Evaluation (T&E) in an Installed Systems Test Facility (ISTF) Using High Performance Computing. In Vassil N. Alexandrov, Jack Dongarra, Benjoe A. Juliano, René S. Renner, Chih Jeng Kenneth Tan, editors, Computational Science - ICCS 2001, International Conference, San Francisco, CA, USA, May 28-30, 2001. Proceedings, Part II. Volume 2074 of Lecture Notes in Computer Science, pages 521-530, Springer, 2001. [doi]
Abstract is missing.