Current-Based Testing, Modeling and Monitoring for Operational Deterioration of a Memristor-Based LUT

T. Nandha Kumar, Haider A. F. Almurib, Fabrizio Lombardi. Current-Based Testing, Modeling and Monitoring for Operational Deterioration of a Memristor-Based LUT. J. Electronic Testing, 32(5):587-599, 2016. [doi]

Abstract

Abstract is missing.