Jinghang Liang, Jie Han, Linbin Chen, Fabrizio Lombardi. Design and reliability analysis of multiple valued logic gates using carbon nanotube FETs. In Csaba Andras Moritz, editor, Proceedings of the 2012 IEEE/ACM International Symposium on Nanoscale Architectures, NANOARCH 2012, Amsterdam, The Netherlands, July 4-6, 2012. pages 131-138, ACM, 2012. [doi]
Abstract is missing.