Philippe Magarshack. Design challenges in 45nm and below: DFM, low-power and design for reliability. In Hai Zhou, Enrico Macii, Zhiyuan Yan, Yehia Massoud, editors, Proceedings of the 17th ACM Great Lakes Symposium on VLSI 2007, Stresa, Lago Maggiore, Italy, March 11-13, 2007. pages 1, ACM, 2007. [doi]
Abstract is missing.