Suitability of Various Low-Power Testing Techniques for IP Core-Based SoC: A Survey

Usha Sandeep Mehta, Kankar S. Dasgupta, Niranjan M. Devashrayee. Suitability of Various Low-Power Testing Techniques for IP Core-Based SoC: A Survey. VLSI Design, 2011, 2011. [doi]

Abstract

Abstract is missing.