Usha Sandeep Mehta - researchr alias

researchr

You are not signed in
Sign in
Sign up

Viewing Publication 1 - 11 from 11

2018

Multiple Missing Cell Defect Modeling for QCA DevicesVaishali H. Dhare, Usha Sandeep Mehta. et, 34(6):623-641, 2018. [doi]

2015

Development of Radiation Hardened by Design(RHBD) primitive gates using 0.18μm CMOS technologyRakesh Trivedi, N. M. Devashrayee, Usha Sandeep Mehta, N. M. Desai, Himanshu Patel. vdat 2015: 1-2 [doi]

2011

Analysis of test data compression techniques emphasizing statistical coding schemesK. A. Bhavsar, Usha Sandeep Mehta. icwet 2011: 1219-1224 [doi]

Suitability of Various Low-Power Testing Techniques for IP Core-Based SoC: A SurveyUsha Sandeep Mehta, Kankar S. Dasgupta, Niranjan M. Devashrayee. vlsi, 2011, 2011. [doi]

Weighted Transition Based Reordering, Columnwise Bit Filling, and Difference Vector: A Power-Aware Test Data Compression MethodUsha Sandeep Mehta, Kankar S. Dasgupta, Nirnjan M. Devashrayee. vlsi, 2011, 2011. [doi]

2010

Modified Selective Huffman Coding for Optimization of Test Data Compression, Test Application Time and Area OverheadUsha Sandeep Mehta, Kankar S. Dasgupta, Nirnjan M. Devashrayee. et, 26(6):679-688, 2010. [doi]

Combining Unspecified Test Data Bit Filling Methods and Run Length Based Codes to Estimate Compression, Power and Area OverheadUsha Sandeep Mehta, Niranjan M. Devashrayee, Kankar S. Dasgupta. isvlsi 2010: 448-449 [doi]

Run-Length-Based Test Data Compression Techniques: How Far from Entropy and Power Bounds? - A SurveyUsha Sandeep Mehta, Kankar S. Dasgupta, Niranjan M. Devashrayee. vlsi, 2010, 2010. [doi]

Combining unspecified test data bit filling methods and run length based codes to estimate compression, power and area overheadUsha Sandeep Mehta, Kankar S. Dasgupta, Niranjan M. Devashrayee. apccas 2010: 40-43 [doi]

Hamming Distance Based 2-D Reordering with Power Efficient Don't Care Bit Filling: Optimizing the test data compression methodUsha Sandeep Mehta, Niranjan M. Devashrayee, Kanker S. Dasgupta. issoc 2010: 1-7 [doi]

2009

Survey of Test Data Compression Technique Emphasizing Code Based SchemesUsha Sandeep Mehta, K. S. Dasgupta, N. M. Devashrayee. dsd 2009: 617-620 [doi]

Sign in or sign up to see more results.

runs on WebDSL