Run-Length-Based Test Data Compression Techniques: How Far from Entropy and Power Bounds? - A Survey

Usha Sandeep Mehta, Kankar S. Dasgupta, Niranjan M. Devashrayee. Run-Length-Based Test Data Compression Techniques: How Far from Entropy and Power Bounds? - A Survey. VLSI Design, 2010, 2010. [doi]

Abstract

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