Usha Sandeep Mehta, Kankar S. Dasgupta, Niranjan M. Devashrayee. Run-Length-Based Test Data Compression Techniques: How Far from Entropy and Power Bounds? - A Survey. VLSI Design, 2010, 2010. [doi]
@article{MehtaDD10,
title = {Run-Length-Based Test Data Compression Techniques: How Far from Entropy and Power Bounds? - A Survey},
author = {Usha Sandeep Mehta and Kankar S. Dasgupta and Niranjan M. Devashrayee},
year = {2010},
doi = {10.1155/2010/670476},
url = {http://dx.doi.org/10.1155/2010/670476},
tags = {rule-based, testing, survey},
researchr = {https://researchr.org/publication/MehtaDD10},
cites = {0},
citedby = {0},
journal = {VLSI Design},
volume = {2010},
}