Run-Length-Based Test Data Compression Techniques: How Far from Entropy and Power Bounds? - A Survey

Usha Sandeep Mehta, Kankar S. Dasgupta, Niranjan M. Devashrayee. Run-Length-Based Test Data Compression Techniques: How Far from Entropy and Power Bounds? - A Survey. VLSI Design, 2010, 2010. [doi]

Authors

Usha Sandeep Mehta

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Kankar S. Dasgupta

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Niranjan M. Devashrayee

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