Imperfection-immune VLSI logic circuits using Carbon Nanotube Field Effect Transistors - researchr publication

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Subhasish Mitra, Jie Zhang, Nishant Patil, Hai Wei. Imperfection-immune VLSI logic circuits using Carbon Nanotube Field Effect Transistors. In Design, Automation and Test in Europe, DATE 2009, Nice, France, April 20-24, 2009. pages 436-441, IEEE, 2009. [doi]

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