Riaz Naseer, Jeff Draper, Younes Boulghassoul, Sandeepan DasGupta, Art Witulski. Critical charge and set pulse widths for combinational logic in commercial 90nm cmos technology. In Hai Zhou, Enrico Macii, Zhiyuan Yan, Yehia Massoud, editors, Proceedings of the 17th ACM Great Lakes Symposium on VLSI 2007, Stresa, Lago Maggiore, Italy, March 11-13, 2007. pages 227-230, ACM, 2007. [doi]
Abstract is missing.