Drew C. Ness, Christian J. Hescott, David J. Lilja. Exploring subsets of standard cell libraries to exploit natural fault masking capabilities for reliable logic. In Hai Zhou, Enrico Macii, Zhiyuan Yan, Yehia Massoud, editors, Proceedings of the 17th ACM Great Lakes Symposium on VLSI 2007, Stresa, Lago Maggiore, Italy, March 11-13, 2007. pages 208-211, ACM, 2007. [doi]
Abstract is missing.