Agathoklis Papadopoulos, Theocharis Theocharides, Maria K. Michael. Towards optimal CMOS lifetime via unified reliability modeling and multi-objective optimization. In International Symposium on Circuits and Systems (ISCAS 2011), May 15-19 2011, Rio de Janeiro, Brazil. pages 1049-1052, IEEE, 2011. [doi]
Abstract is missing.