Masood Qazi, Mehul Tikekar, Lara Dolecek, Devavrat Shah, Anantha Chandrakasan. Loop flattening & spherical sampling: Highly efficient model reduction techniques for SRAM yield analysis. In Design, Automation and Test in Europe, DATE 2010, Dresden, Germany, March 8-12, 2010. pages 801-806, IEEE, 2010. [doi]
Abstract is missing.