Devendra Rai, Hoeseok Yang, Iuliana Bacivarov, Jian-Jia Chen, Lothar Thiele. Worst-case temperature analysis for real-time systems. In Design, Automation and Test in Europe, DATE 2011, Grenoble, France, March 14-18, 2011. pages 631-636, IEEE, 2011. [doi]
Abstract is missing.