Datapath BIST Insertion Using Pre-Characterized Area and Testability Data

J. C. Wang, Paulo Sérgio Cardoso, J. A. Q. Gonzalez, Marius Strum, R. Pires. Datapath BIST Insertion Using Pre-Characterized Area and Testability Data. J. Electronic Testing, 20(4):333-344, 2004. [doi]

Abstract

Abstract is missing.