Dong Wang, Xiaoyang Tan. Robust Distance Metric Learning in the Presence of Label Noise. In Carla E. Brodley, Peter Stone, editors, Proceedings of the Twenty-Eighth AAAI Conference on Artificial Intelligence, July 27 -31, 2014, Québec City, Québec, Canada. pages 1321-1327, AAAI Press, 2014. [doi]
Abstract is missing.