Designs and analysis of non-volatile memory cells for single event upset (SEU) tolerance

Wei Wei, Fabrizio Lombardi, Kazuteru Namba. Designs and analysis of non-volatile memory cells for single event upset (SEU) tolerance. In 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014, Amsterdam, The Netherlands, October 1-3, 2014. pages 69-74, IEEE, 2014. [doi]

Abstract

Abstract is missing.