Compact Test Generation With an Influence Input Measure for Launch-On-Capture Transition Fault Testing

Dong Xiang, Wenjie Sui, Boxue Yin, Kwang-Ting Cheng. Compact Test Generation With an Influence Input Measure for Launch-On-Capture Transition Fault Testing. IEEE Trans. VLSI Syst., 22(9):1968-1979, 2014. [doi]

Abstract

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