Seed selection in LFSR-reseeding-based test compression for the detection of small-delay defects

Mahmut Yilmaz, Krishnendu Chakrabarty. Seed selection in LFSR-reseeding-based test compression for the detection of small-delay defects. In Design, Automation and Test in Europe, DATE 2009, Nice, France, April 20-24, 2009. pages 1488-1493, IEEE, 2009. [doi]

Abstract

Abstract is missing.