An industrial case study of analog fault modeling

Ender Yilmaz, Anne Meixner, Sule Ozev. An industrial case study of analog fault modeling. In 29th IEEE VLSI Test Symposium, VTS 2011, May 1-5, 2011, Dana Point, California, USA. pages 178-183, IEEE Computer Society, 2011. [doi]

Abstract

Abstract is missing.