Abstract is missing.
- Hazards of VerificationDaniel Jackson. 1 [doi]
- Automata-Theoretic Model Checking RevisitedMoshe Y. Vardi. 2 [doi]
- Proofs, Interpolants, and Relevance HeuristicsKen McMillan. 3 [doi]
- Is Verification Getting Too Complex?Yoav Hollander. 4 [doi]
- Can Mutation Analysis Help Fix Our Broken Coverage Metrics?Brian Bailey. 5 [doi]
- Practical Considerations Concerning HL-to -RT Equivalence CheckingCarl Pixley. 6 [doi]
- A Framework for Inherent VacuityDana Fisman, Orna Kupferman, Sarai Sheinvald-Faragy, Moshe Y. Vardi. 7-22 [doi]
- A Meta Heuristic for Effectively Detecting Concurrency ErrorsNeha Rungta, Eric G. Mercer. 23-37 [doi]
- A Uniform Approach to Three-Valued Semantics for µ-Calculus on Abstractions of Hybrid AutomataKerstin Bauer, Raffaella Gentilini, Klaus Schneider. 38-52 [doi]
- Automatic Boosting of Cross-Product Coverage Using Bayesian NetworksDorit Baras, Laurent Fournier, Avi Ziv. 53-67 [doi]
- Efficient Decision Procedure for Bounded Integer Non-linear Operations Using SMT()Malay K. Ganai. 68-83 [doi]
- Evaluating Workloads Using Comparative Functional CoverageYoram Adler, Dale Blue, Thomas Conti, Richard Prewitt, Shmuel Ur. 84-98 [doi]
- Iterative Delta DebuggingCyrille Artho. 99-113 [doi]
- Linear-Time Reductions of Resolution ProofsOmer Bar-Ilan, Oded Fuhrmann, Shlomo Hoory, Ohad Shacham, Ofer Strichman. 114-128 [doi]
- Significant Diagnostic Counterexamples in Probabilistic Model CheckingMiguel E. Andrés, Pedro R. D Argenio, Peter van Rossum. 129-148 [doi]
- Statistical Model Checking of Mixed-Analog Circuits with an Application to a Third Order Delta-Sigma ModulatorEdmund M. Clarke, Alexandre Donzé, Axel Legay. 149-163 [doi]
- Structural ContradictionsCindy Eisner, Dana Fisman. 164-178 [doi]
- Synthesizing Test Models from Test CasesAntti Jääskeläinen, Antti Kervinen, Mika Katara, Antti Valmari, Heikki Virtanen. 179-193 [doi]
- d-TSR: Parallelizing SMT-Based BMC Using Tunnels over a Distributed FrameworkMalay K. Ganai, Weihong Li. 194-199 [doi]
- Progress in Automated Software Defect PredictionThomas J. Ostrand, Elaine J. Weyuker. 200-204 [doi]
- SeeCode - A Code Review Plug-in for EclipseMoran Shochat, Orna Raz, Eitan Farchi. 205-209 [doi]
- User-Friendly Model Checking: Automatically Configuring Algorithms with RuleBase/PEZiv Nevo. 210-214 [doi]